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JExample: Exploiting Dependencies between Tests to Improve Defect Localization.

Adrian KuhnBart Van RompaeyLea HaensenbergerOscar NierstraszSerge DemeyerMarkus GälliKoenraad Van Leemput
Published in: XP (2008)
Keyphrases
  • image segmentation
  • three dimensional
  • information systems
  • knowledge base
  • face recognition
  • training data
  • search algorithm
  • expert systems
  • relational databases
  • special case
  • test data