Login / Signup

Modeling Impact-induced Failure of Polysilicon MEMS: A Multi-scale Approach.

Stefano MarianiAldo GhisiAlberto CoriglianoSarah Zerbini
Published in: Sensors (2009)
Keyphrases
  • multiscale
  • edge detection
  • website
  • random access memory
  • databases
  • image segmentation
  • data structure
  • data model