Built-in self test of high speed analog-to-digital converters.
Edinei SantinLuís B. OliveiraJoão GoesPublished in: IEEE Instrum. Meas. Mag. (2019)
Keyphrases
- high speed
- mixed signal
- low power
- circuit design
- built in self test
- printed circuit
- focal plane
- data conversion
- sigma delta
- digital images
- artificial intelligence
- decision trees
- delta sigma
- multi channel
- genetic algorithm
- real world
- integrated circuit
- digital media
- low cost
- artificial neural networks
- website
- information systems
- data sets