Classification under Nuisance Parameters and Generalized Label Shift in Likelihood-Free Inference.
Luca MasseranoAlex ShenMichele DoroTommaso DorigoRafael IzbickiAnn B. LeePublished in: CoRR (2024)
Keyphrases
- class labels
- classification accuracy
- pattern recognition
- support vector
- classification scheme
- multi label
- multi label classification
- support vector machine
- supervised learning
- machine learning methods
- image classification
- feature set
- feature space
- decision trees
- feature vectors
- text classification
- maximum likelihood
- unsupervised learning
- training samples
- support vector machine svm
- machine learning
- bayesian model
- classification process
- bayesian inference
- pattern classification
- data sets
- decision rules
- benchmark datasets
- training set
- bayesian networks
- training data
- neural network