A review of reference architectures for digital manufacturing: Classification, applicability and open issues.
Jan KaiserDuncan C. McFarlaneGregory HawkridgePascal AndréPaulo LeitãoPublished in: Comput. Ind. (2023)
Keyphrases
- open issues
- automatic classification
- image classification
- feature selection
- decision trees
- classification systems
- classification algorithm
- classification scheme
- preprocessing
- feature space
- feature vectors
- classification accuracy
- classification models
- decision rules
- class labels
- machine learning methods
- object classification
- future trends
- support vector machine svm
- pattern recognition
- feature extraction
- machine learning
- cross validation
- data sets
- machine learning algorithms
- classification rules
- pattern classification
- manufacturing systems
- unsupervised learning
- support vector
- training data
- classification rate
- supervised classification
- neural network