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Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle.
Thibault P. Delhaye
Nicolas Roisin
Nicolas André
Laurent A. Francis
Denis Flandre
Published in:
IEEE SENSORS (2021)
Keyphrases
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automatic detection
false positives
information systems
anomaly detection
detection algorithm
detection method
change detection
false alarms
detection scheme
quasi static
database
computer vision
digital images
database management systems
automated detection