Investigation of histogram method implementation for high resolution ADC testing.

Roman V. Kochan Orest Kochan G. Sapojnyk Mykhaylo Chyrka

Published in: IDAACS (1) (2011)

Keyphrases

computational cost
detection method
high precision
high accuracy
computational complexity
preprocessing
high resolution
cost function
probabilistic model
gray level
test data
high order
pixel values