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Investigation of geometry dependence on MOSFET linearity in the impact ionization region using Volterra series.

Chie-In LeeWei-Cheng LinYan-Ting Lin
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • three dimensional
  • least squares
  • data sets
  • high impact
  • higher order statistics
  • information systems
  • region of interest
  • information geometry