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Cosmic-ray soft error rate characterization of a standard 0.6-μm CMOS process.

Peter HazuchaChrister SvenssonStephen A. Wender
Published in: IEEE J. Solid State Circuits (2000)
Keyphrases
  • error rate
  • test set
  • misclassification rate
  • lower error rates
  • equal error rate
  • word error rate
  • information retrieval
  • estimation error