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Cosmic-ray soft error rate characterization of a standard 0.6-μm CMOS process.
Peter Hazucha
Christer Svensson
Stephen A. Wender
Published in:
IEEE J. Solid State Circuits (2000)
Keyphrases
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error rate
test set
misclassification rate
lower error rates
equal error rate
word error rate
information retrieval
estimation error