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A threshold voltage model for short-channel MOSFETs taking into account the varying depth of channel depletion layers around the source and drain.
Srimanta Baishya
Abhijit Mallik
Chandan Kumar Sarkar
Published in:
Microelectron. Reliab. (2008)
Keyphrases
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mathematical model
probabilistic model
cost function
experimental data
formal model
management system
parameter estimation
analytical model
genetic algorithm
objective function
multi channel