Bayesian and Decision Tree Approaches for Pattern Recognition Including Feature Measurement Costs.
G. R. DattatreyaV. V. S. SarmaPublished in: IEEE Trans. Pattern Anal. Mach. Intell. (1981)
Keyphrases
- pattern recognition
- decision trees
- strengths and weaknesses
- neural network
- image processing
- machine learning
- feature extraction
- image analysis
- signal processing
- data driven
- maximum likelihood
- machine learning algorithms
- bayesian inference
- data sets
- data mining
- active learning
- classification accuracy
- generative model
- logistic regression