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Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI.

Martin RackLucas NyssensQuentin CourteDimitri LedererJean-Pierre Raskin
Published in: ESSDERC (2021)
Keyphrases
  • silicon on insulator
  • cmos technology
  • low cost
  • real time
  • high speed
  • frequency band
  • metal oxide semiconductor