Login / Signup

Normally-Off AlGaN/GaN HEMTs with Thin InGaN Cap Layer.

Masafumi ItoShigeru KishimotoFumihiko NakamuraTakashi Mizutani
Published in: IEICE Trans. Electron. (2008)
Keyphrases
  • multi layer
  • application layer
  • lower bound
  • data mining
  • genetic algorithm
  • image processing
  • expert systems
  • multiple layers
  • upper layer