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A body-biasing of readout circuit for STT-RAM with improved thermal reliability.

Lun YangYuanqing ChengYuhao WangHao YuWeisheng ZhaoAida Todri-Sanial
Published in: ISCAS (2015)
Keyphrases
  • parallel processing
  • improved algorithm
  • infrared
  • circuit design
  • genetic algorithm
  • high speed
  • relational databases
  • human body
  • power system
  • main memory
  • power plant
  • analog circuits