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Pathological Element-Based Active Device Models and Their Application to Symbolic Analysis.
Carlos Sánchez-López
Francisco V. Fernández
Esteban Tlelo-Cuautle
Sheldon X.-D. Tan
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2011)
Keyphrases
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probabilistic model
parameter estimation
data acquisition
prior knowledge
statistical models
neural network
genetic algorithm
information systems
decision support
machine learning algorithms
quantitative analysis
model driven
connectionist models
model validation