Static RAM generators with automated characterization techniques for a 0.5 micron triple-metal embedded array.

Puneet Sawhney Haroon Rasheed

Published in: VLSI Design (1995)

Keyphrases

embedded systems
random access memory
fully automatic
fully automated
computer aided
case study
data driven
semi automated
database systems
database
information retrieval
computer assisted
main memory
data mining
neural network
automated analysis
databases