Towards a Classification of Binary Similarity Measures.
Iván Ramírez MejiaIldar Z. BatyrshinPublished in: MICAI (1) (2017)
Keyphrases
- similarity measure
- feature vectors
- classification accuracy
- support vector
- pattern recognition
- decision trees
- feature extraction
- support vector machine svm
- benchmark datasets
- pattern classification
- classification method
- classification algorithm
- unsupervised learning
- multi class svm
- classification process
- classification scheme
- document classification
- training data
- cross validation
- machine learning
- image classification
- class labels
- support vector machine
- bayesian networks
- classification models
- machine learning algorithms
- automatic classification
- class imbalance
- constraint satisfaction problems
- supervised classification
- image registration
- multi class classification
- non binary
- binary classification problems