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Effect of wafer thinning methods towards fracture strength and topography of silicon die.

Hoh Huey JiunIbrahim AhmadAzman JalarGhazali Omar
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • data sets
  • significant improvement
  • neural network
  • data mining techniques
  • data mining
  • decision trees
  • multiscale
  • preprocessing
  • medical images
  • empirical studies
  • classification method
  • statistical methods