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AC Resistance of Copper Clad Aluminum Wires.

Ning GuanChihiro KamidakiTakashi ShinmotoKen'ichiro Yashiro
Published in: IEICE Trans. Commun. (2013)
Keyphrases
  • thin film
  • high density
  • multi layer
  • arc consistency
  • silicon nitride
  • machine learning
  • computer vision
  • image segmentation
  • three dimensional
  • power supply
  • learning algorithm
  • np complete