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TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis.
Alejandro Czutro
Ilia Polian
Matthew Lewis
Piet Engelke
Sudhakar M. Reddy
Bernd Becker
Published in:
VLSI Design (2009)
Keyphrases
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pattern generator
database
neural network
spatio temporal
quantitative analysis
data analysis
real time
information systems
computational complexity
image analysis
statistical analysis