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Comparative Study of Single, Regular and Flip Well Subthreshold SRAMs in 22 nm FDSOI Technology.
Somayeh Hossein Zadeh
Trond Ytterdal
Snorre Aunet
Published in:
NorCAS (2020)
Keyphrases
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comparative study
data processing
rapid development
key technologies
cost effective
neural network
data mining
case study
database
data sets
machine learning
multi agent