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Comparative Study of Single, Regular and Flip Well Subthreshold SRAMs in 22 nm FDSOI Technology.

Somayeh Hossein ZadehTrond YtterdalSnorre Aunet
Published in: NorCAS (2020)
Keyphrases
  • comparative study
  • data processing
  • rapid development
  • key technologies
  • cost effective
  • neural network
  • data mining
  • case study
  • database
  • data sets
  • machine learning
  • multi agent