Login / Signup
Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs.
Alok Kumar
Tarun Kumar Gupta
Bhavana P. Shrivastava
Abhinav Gupta
Published in:
Microelectron. J. (2023)
Keyphrases
</>
human computer interaction
signal to noise ratio
maximum likelihood
input data
sensitivity analysis
noisy data
noise variance
image processing
expectation maximization
parameter estimation
missing data
parameter space
noise reduction
parameter values