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Automatic Industry PCB Board DIP Process Defect Detection with Deep Ensemble Method.

Yu-Ting LiPaul KuoJiun-In Guo
Published in: ISIE (2020)
Keyphrases
  • defect detection
  • ensemble methods
  • prediction accuracy
  • feature extraction
  • ensemble learning
  • neural network
  • multi class
  • benchmark datasets
  • machine learning methods