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ESD sensitivity investigation on a wide range of high density embedded capacitors.

Frédéric BarbierSébastien Jacqueline
Published in: Microelectron. Reliab. (2008)
Keyphrases
  • high density
  • wide range
  • low density
  • close proximity
  • data center
  • high bandwidth
  • high power
  • magnetic recording
  • thin film
  • magnetic tape
  • embedded systems
  • sensitivity analysis
  • digital forensics
  • real world
  • multiscale