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A 32-bit 16-program-cycle nonvolatile memory for analog circuit calibration in a standard 0.18µm CMOS.

Jun Gyu LeeShoichi Masui
Published in: IEICE Electron. Express (2012)
Keyphrases
  • analog circuits
  • random access memory
  • analog to digital converter
  • high speed
  • low power
  • fault diagnosis
  • camera calibration
  • power consumption
  • genetic algorithm
  • power dissipation