Wafer Pattern Counting, Detection and Classification Based on Encoder-Decoder CNN Structure.
Yu LinPublished in: EIT (2022)
Keyphrases
- support vector
- classification accuracy
- low complexity
- decision trees
- image classification
- neural network
- training set
- feature vectors
- pattern detection
- feature selection
- convolutional neural network
- digital mammograms
- decoding process
- distributed video coding
- temporal correlation
- cellular neural networks
- video codec
- detection algorithm
- rate distortion
- false positives
- detection method
- error control
- object detection
- support vector machine
- wyner ziv video coding
- feature extraction