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Fast thermal profiling of power semiconductor devices using Fourier techniques.
Jody J. Nelson
Giri Venkataramanan
Ayman M. El-Refaie
Published in:
IEEE Trans. Ind. Electron. (2006)
Keyphrases
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semiconductor devices
electron beam
infrared
power consumption
electrical power
frequency domain
fourier transform
fourier domain
fourier analysis
search algorithm
image reconstruction
steady state
visible spectrum
field effect transistors
fourier spectrum