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A digital calibration technique canceling non-linear switch and package impedance effects of a 1.6GS/s TX-DAC in 28 nm CMOS.
Hossein Ghafarian
Friedel Gerfers
Published in:
ISCAS (2017)
Keyphrases
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high speed
metal oxide semiconductor
circuit design
cmos image sensor
low cost
camera calibration
cmos technology
mixed signal
silicon on insulator
camera parameters
power supply