Login / Signup
Built-in self-test (BIST) design of high-speed carry-free dividers.
Chin-Long Wey
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (1996)
Keyphrases
</>
built in self test
high speed
integrated circuit
real time
databases
database
design process
e learning
low cost
user experience
design principles
engineering design
design methodology
design space