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Strain-Reduction Induced Rise in Channel Temperature at Ohmic Contacts of GaN HEMTs.

Steven J. DuffyBrahim BenbakhtiKarol KalnaMohammed BouchertaWei Dong ZhangNour E. BourzguiAli Soltani
Published in: IEEE Access (2018)
Keyphrases
  • electric field
  • multi channel
  • neural network
  • quasi static
  • noisy channel
  • structuring elements
  • data reduction
  • communication channels
  • finite element analysis
  • high temperature
  • antenna array