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A Prony-Based Curve-Fitting Method for Characterization of RF Pulses From Optoelectronic Devices.

Saptarshi MukherjeeKaren DowlingYicong DongKexin LiAdam ConwayShaloo RakhejaLars F. Voss
Published in: IEEE Signal Process. Lett. (2022)
Keyphrases
  • fitting method
  • model fitting
  • radio frequency
  • active appearance models
  • embedded systems
  • image sequences
  • feature extraction
  • statistical model