Method and Application of Spraying Developer Defect Detection in Three-Dimensional Optical Scanning Measurement Process Based on YOLO v7.
Zhanhui WangQisheng ZhaoChaojie FengPublished in: IEEE Access (2024)
Keyphrases
- three dimensional
- detection method
- synthetic data
- preprocessing
- cost function
- segmentation method
- development process
- high accuracy
- computational cost
- experimental evaluation
- source code
- classification process
- neural network
- high precision
- defect detection
- matching process
- recognition process
- matching algorithm
- depth map
- d objects
- dynamic programming
- significant improvement
- objective function
- similarity measure
- case study