Recognizing black point in wheat kernels and determining its extent using multidimensional feature extraction and a naive Bayes classifier.
Chengquan ZhouGuijun YangDong LiangJun HuHao YangJibo YueRuirui YanLiang HanLinsheng HuangLijun XuPublished in: Comput. Electron. Agric. (2021)
Keyphrases
- naive bayes classifier
- feature extraction
- naive bayes
- feature space
- text classification
- image processing
- dimension reduction
- face recognition
- feature selection
- classification error
- classification accuracy
- support vector machine
- feature vectors
- support vector machine svm
- noisy data
- variable selection
- probabilistic model
- principal component analysis
- feature set
- kernel function
- linear discriminant analysis
- decision trees
- continuous variables