Fork-Coupled Resonators for High-Frequency Characterization of Dielectric Substrate Materials.
Ali Hussein MuqaibelAhmad Safaai-JaziSedki M. RiadPublished in: IEEE Trans. Instrum. Meas. (2006)
Keyphrases
- high frequency
- low frequency
- dielectric constant
- high resolution
- visual quality
- high frequencies
- subband
- wavelet transform
- low pass
- wavelet coefficients
- wavelet domain
- wavelet decomposition
- blocking artifacts
- multi resolution analysis
- image segmentation
- electrical properties
- phase shifting
- high frequency components
- simulation software
- discrete wavelet transform
- data fusion