Extreme Temperature (> 200 °C), Radiation Hard (> 1 Mrad), Dense (sub-50 nm CD), Fast (2 ns write pulses), Non-Volatile Memory Technology.
Saurabh V. SuryavanshiGreg YericMax IrbyX. M. Henry HuangGlen RosendaleLucian ShifrenPublished in: IMW (2022)
Keyphrases
- main memory
- x ray
- rapid development
- data processing
- database management systems
- memory usage
- data storage
- infrared
- cost effective
- flash memory
- neural network
- memory requirements
- nm technology
- network simulator
- read write
- cmos technology
- embedded systems
- file system
- index structure
- data management
- query processing
- data structure