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Package and Chip Accelerated Aging Methods for Power MOSFET Reliability Evaluation.
Ting-You Lin
Chauchin Su
Chung-Chih Hung
Karuna Nidhi
Chily Tu
Shao-Chang Huang
Published in:
DATE (2019)
Keyphrases
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gold standard
database
qualitative and quantitative
evaluation methods
preprocessing
benchmark datasets
evaluation criteria
data sets
neural network
low cost