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WDC-YOLO: an improved YOLO model for small objects oriented printed circuit board defect detection.

Xudong SongYucheng WangChangxian LiLifang Song
Published in: J. Electronic Imaging (2024)
Keyphrases
  • mathematical model
  • object model
  • probabilistic model
  • defect detection
  • e learning
  • knowledge base
  • pattern recognition
  • knowledge discovery
  • object oriented