Improved Algorithms for Constructive Multi-Phase Test Point Insertion for Scan Based BIST.
Nadir Z. BasturkmenSudhakar M. ReddyJanusz RajskiPublished in: VLSI Design (2002)
Keyphrases
- computational cost
- orders of magnitude
- preprocessing phase
- learning algorithm
- recently developed
- data structure
- classification algorithm
- computationally efficient
- benchmark datasets
- optimization problems
- computationally expensive
- theoretical analysis
- machine learning
- worst case
- significant improvement
- knowledge base
- information retrieval