Login / Signup
Numerical Estimation of Yield in Sub-100-nm SRAM Design Using Monte Carlo Simulation.
Hyunwoo Nho
Sei-Seung Yoon
S. Simon Wong
Seong-Ook Jung
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2008)
Keyphrases
</>
monte carlo simulation
markov chain
monte carlo
user interface
design process
power consumption
search algorithm
state space
low cost
parameter estimation
low power
engineering design
cmos technology