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Characterization and Model Validation of Mismatch in Nanometer CMOS at Cryogenic Temperatures.

Pascal Alexander 't HartJeroen P. G. van DijkMasoud BabaieEdoardo CharbonAndrei VladimirescuFabio Sebastiano
Published in: ESSDERC (2018)
Keyphrases
  • model validation
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  • neural network
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  • circuit design
  • electron microscopy
  • electric field
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