, with embedded signal processing using an ultra-low power ASIC designed for testability.

Devarshi Mrinal Das Aman Gupta Abhishek Srivastava Amogh Vidwans Meraj Ahmad Aniruddha Shelke Salil Kale J. Ananthapadmanabhan Dinesh Kumar Sharma Maryam Shojaei Baghini

Published in: Microelectron. J. (2018)

Keyphrases