Login / Signup

Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology.

Y. JiH. J. GooJ. LimS. B. LeeS. LeeTaiki UemuraJ. C. ParkS. I. HanS. C. ShinJ. H. LeeY. J. SongK. M. LeeH. M. ShinS. H. HwangB. Y. SeoY. K. LeeJ. C. KimG. H. KohK. C. ParkSangwoo PaeGi-Tae JeongJ. S. YoonE. S. Jung
Published in: IRPS (2019)
Keyphrases