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A simulation-based approach to test pattern generation for synchronous sequential circuits.

Paolo CamuratiFulvio CornoFulvio PrinettoMatteo Sonza Reorda
Published in: VTS (1992)
Keyphrases
  • high speed
  • circuit design
  • multiscale
  • database
  • real time
  • databases
  • genetic algorithm
  • computer vision
  • case study
  • objective function
  • mobile robot
  • delay insensitive
  • vlsi circuits