Machine Learning (ML)-Based Model to Characterize the Line Edge Roughness (LER)-Induced Random Variation in FinFET.
Jaehyuk LimChanghwan ShinPublished in: IEEE Access (2020)
Keyphrases
- machine learning
- computational model
- probabilistic model
- probability distribution
- evolutionary algorithm
- prediction model
- natural language
- maximum likelihood
- theoretical analysis
- heavy tailed
- formal model
- statistical model
- parameter estimation
- em algorithm
- video sequences
- high level
- computer vision
- artificial intelligence
- learning algorithm