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Overview of Ferroelectric Memory Devices and Reliability Aware Design Optimization.
Shan Deng
Zijian Zhao
Santosh Kurinec
Kai Ni
Yi Xiao
Tongguang Yu
Vijaykrishnan Narayanan
Published in:
ACM Great Lakes Symposium on VLSI (2021)
Keyphrases
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memory requirements
mobile devices
low memory
reliability analysis
memory usage
neural network
main memory
memory size
computer vision
e learning
intelligent environments
memory space
handheld devices
memory footprint