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Bit-line Sense Amplifier Using PMOS Charge Transfer Pre-amplifier for Low-Voltage DRAM.

Choong Keun LeeTaegun YimHongil Yoon
Published in: TENCON (2018)
Keyphrases
  • low voltage
  • random access memory
  • design considerations
  • power line
  • dynamic range
  • power management
  • leakage current