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A novel PUF based on cell error rate distribution of STT-RAM.

Xian ZhangGuangyu SunYaojun ZhangYiran ChenHai LiWujie WenJia Di
Published in: ASP-DAC (2016)
Keyphrases
  • error rate
  • expected loss
  • test set
  • lower error rates
  • misclassification rate
  • word error rate
  • rule sets
  • machine learning
  • objective function
  • multi class
  • training error
  • electronic devices
  • false discovery rate