Self-adaptive testing to determine sample size for flash memory solutions.
Chul-Hoon ByunChang-Kyun JeonTaek LeeHoh Peter InPublished in: KSII Trans. Internet Inf. Syst. (2014)
Keyphrases
- sample size
- flash memory
- statistical tests
- model selection
- random sampling
- small sample size
- upper bound
- small sample
- statistical power
- pac learning
- disk drives
- small samples
- garbage collection
- solid state
- progressive sampling
- embedded systems
- file system
- random sample
- worst case
- statistical hypothesis testing
- variance reduction
- database systems
- databases
- data storage
- storage devices
- data management
- software development
- machine learning