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Triple Patterning Lithography Aware Optimization and Detailed Placement Algorithms for Standard Cell-Based Designs.
Jian Kuang
Wing-Kai Chow
Evangeline F. Y. Young
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
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optimization problems
computational cost
combinatorial optimization
stochastic search
theoretical analysis
significant improvement
linear programming
computationally efficient
discrete optimization
learning algorithm
data structure
worst case
machine learning algorithms
recently developed
optimization process