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Innovative Practice on Wafer Test Innovations.

Dyi-Chung HuHirohito HashimotoLi-Fong TsengKen Chau-Cheung ChengKatherine Shu-Min LiSying-Jyan WangSean Y.-S. ChenJwu E. ChenClark LiuAndrew Yi-Ann Huang
Published in: VTS (2020)
Keyphrases
  • semiconductor manufacturing
  • expert systems
  • data sets
  • data mining
  • computer vision
  • image segmentation
  • computer science
  • artificial neural networks
  • integrated circuit
  • test driven development